ML3004 X Ray Diffraction and Associated Techniques Syllabus:
ML3004 X Ray Diffraction and Associated Techniques Syllabus – Anna University Regulation 2021
COURSE OBJECTIVES:
The main learning objective of this course is to prepare the students for
1. Acquiring knowledge on the basic concepts of production of X-rays and their interaction with matter
2. Gaining knowledge on the basics of X-ray diffraction and stereographic projection
3. Understanding and analysing XRD results to identify the phases
4. Getting familiarized with the various methods for identification of the phases in the crystals
5. Acquiring knowledge on the residual stress measurement using X-ray diffraction method
UNIT – I X-RAY GENERATION AND INTERACTION WITH MATERIALS
X-ray – generation – soft and hard x –ray – shortest wavelength – characteristic x –ray – continuous x-ray – absorption – absorption edges – elastic scattering – by an electron, electrons of an atom and atomic arrangements – x-ray fluorescence – elemental identification – collimators – detectors – precautions
UNIT – II X-RAY DIFFRACTION (XRD): BASICS
Bragg’s law, Diffraction methods – Laue, rotating crystal and powder methods- Stereographic projection – texture and orientation- Intensity of diffracted beams –structure factor calculations
UNIT – III XRD FOR PHASE IDENTIFICATION – I
Crystallite size – Scherrer – Stokes and Wilson – Importance of Rietveld refinement in XRD (fundamental) Precise parameter measurement – Phase identification –ASTM catalogue of Materials identification – Grazing incidence XRD
UNIT – IV XRD FOR PHASE QUANTIFICATION – II
Internal standard – External standard – Direct comparison – single phase quantification – calibration – practical difficulties
UNIT – V XRD RESIDUAL STRESS MEASUREMENT
Warrens Method, lattice strain calculation – double exposure method – powder diffraction and diffractometer – sin2 ψ technique
TOTAL : 45 PERIODS
COURSE OUTCOMES:
Upon Completion of the course, the students will be able to
1. Explain the methods of X-ray production and their interaction with the matter
2. Discuss on the basics of X-ray diffraction and the intensity of diffracted beams
3. Determine the crystal size using the results obtained from XRD
4. Identify the phases that are present in the various alloys
5. Predict the amount of residual stresses associated with the materials
TEXT BOOKS
1. Angelo, P.C., “Materials Characterisation”, 1st Edition Cengage Publication, 2016.
2. Cullity, B. D.,Stock, S.R. “ Elements of X-ray diffraction”, Pearson New International Edition, 3rd Edition, 2014
REFERENCES
1. Whan R E (Ed), ASM Handbook, Volume 10, Materials Characterisation “, Ninth Edition, ASM international, USA, 1986.
2. Yang Leng, Materials Characterization: Introduction to Microscopic and Spectroscopic Methods, Hong Kong University Of Science And Technology, John Wiley & Sons (Asia) Pte Ltd. 2010.