CEC342 Mixed Signal IC Design Testing Syllabus:
CEC342 Mixed Signal IC Design Testing Syllabus – Anna University Regulation 2021
COURSE OBJECTIVES:
● To know about mixed-signal devices and the need for testing these devices.
● To study the various techniques for testing.
● To learn about ADC and DAC based testing.
● To understand the Clock and Serial Data Communications Channels
● To study the general purpose measuring devices.
UNIT I MIXED – SIGNAL TESTING
Common Types of Analog and Mixed- Signal Circuits – Applications of Mixed-Signal Circuits – PostSilicon Production Flow – Test and Packing – Characterization versus Production Testing – Test and Diagnostic Equipment – Automated Test Equipments – Wafer Probers – Handlers – E-Beam Probers – Focused Ion Beam Equipments – Forced –Temperature
UNIT II YIELD, MEASUREMENT ACCURACY, AND TEST TIME
Yield – Measurement Terminology – Repeatability, Bias, and Accuracy – Calibrations and Checkers – Tester Specifications – Reducing Measurement Error with Greater Measurement Time – Guardbands – Effects of Measurement Variability on Test Yield – Effects of Reproducibilty and Process Variation on Yield – Statistical Process Control
UNIT III DAC TESTING
Basics of Data Converters -Principles of DAC and ADC Conversion, Data Formats, Comparison of DACs and ADCs, DAC Failure Mechanisms – Basic DC Tests – Transfer Curve Tests – Dynamic DAC Tests – Tests for Common DAC Applications
UNIT IV ADC TESTING
ADC Testing Versus DAC Testing – ADC Code Edge Measurements – Edge Code Testing Versus Center Code Testing, Step Search and Binary Search Methods, Servo Method, Linear Ramp Histogram Method, Histograms to Code Edge Transfer Curves, Rising Ramps Versus Falling Ramps, Sinusoidal Histogram Method – DC Tests and Transfer Curve Tests – Dynamic ADC Tests – Tests for Common ADC Applications
UNIT V CLOCK AND SERIAL DATA COMMUNICATIONS CHANNEL MEASUREME
Synchronous and Asynchronous Communications – Time-Domain Attributes of a Clock Signal – Frequency-Domain Attributes of a Clock Signal – Communicating Serially Over a Channel – Bit Error Rate Measurement – Methods to Speed Up BER Tests in Production – Deterministic Jitter Decomposition – Jitter Transmission Tests.
30 PERIODS
COURSE OUTCOMES:
Upon successful completion of the course the student will be able to
CO1: Learn the fundamentals of mixed signal circuits.
CO2: Define the various measurement terminologies.
CO3: Acquire knowledge of Analog to Digital Converters.
CO4: Learn testing of Analog to Digital Converters.
CO5:Comprehend the attributes of a clock signal.
TEXTBOOK:
1. Gordon W.Roberts, Friedrich Taenzler, Mark Burns, “An Introduction to Mixed-signal IC Test and Measurement” Oxford University Press, Inc.2012 (Unit I – V)
2. M.L.Bushnell and V.D.Agrawal, “Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits”, Kluwer Academic Publishers, 2002. (Unit – III)
3. BapirajuVinnakota, “Analog and mixed-signal test”, Prentice Hall, 1998.(Unit – II)
4. Digital and Analogue Instrumentation: Testing and Measurement by NihalKularatna
PRACTICAL EXERCISES: 30 PERIODS
DESIGN AND TESTING OF THE FOLLOWING CIRCUITS
1. PLL characteristics and its use as Frequency Multiplier, Clock synchronization
2. R-2R Ladder Type and Flash Type ADC.
3. DC power supply using LM317 and LM723.
4. Design of asynchronous counter
5. Design of synchronous counter
6. Implementation and Testing of RS Latch and Flip-flops