AN3001 Computer Aided Inspection Syllabus:
AN3001 Computer Aided Inspection Syllabus – Anna University Regulation 2021
COURSE OBJECTIVES
1 To study the various optical measuring instruments used in industries.
2 To study the importance of surface metrology and the different methods of measuring surface finish.
3 To study the advanced concepts relevant to operational characteristics of CMMS.
4 To study the various errors involved in precision manufacturing.
5 To study the concepts of nanometrology.
UNIT – I OPTICAL DIMENSIONAL METROLOGY
Basic to advanced metrology evolution, Optical dimensional metrology of precision features – Machine vision, Laser Tracking Systems, Laser scanners, White-Light Interference 3D Microscopes, Focus variation based Optical Metrology- Fringe projection method.
UNIT – II ADVANCES IN SURFACE METROLOGY
Surface Geometry and Its Importance in Function, Surfaces and Manufacture, Filtering – Gaussian, 2RC, Advanced Filters, Surface finish parameters – Amplitude, Spacing, Hybrid, Shape, Autocorrelation, Power Spectral Density, Bearing Area.3D areal and parametric measurement, Need for 3D surface topography measurement, Stylus instruments, Optical Instruments – Chromatic confocal Microscopy, Interferometry, Non-optical Scanning Microscopy – Scanning electron Microscopes, Scanning probe microscopes, Parameters for characterizing 3D surface topography.
UNIT – III COORDINATE METROLOGY
Coordinate measuring system – algorithms and filters, Performance evaluation, Temperature fundamentals, Environmental control, Error compensation of CMMs, Calibration and Measurement uncertainty for coordinate measuring systems
UNIT – IV METROLOGY OF MACHINE TOOLS
Sources of error, Principles of measurement, Errors due to machine elements, bearings, spindles, Kinematic design, Structural compliance. Vibration, Thermal errors – background, thermal effects, Environmental control of precision machinery. Error mapping and error budgets.
UNIT – V NANOMETROLOGY
Precision to Nanometrology, Optical Micro-Metrology of Small Objects – White-Light Interference 3D Microscopes, Focus-Based Optical Metrology- Fringe projection method, Measurement of Typical Nanofeatures, Measuring Length to Nanoscale with Interferometers and Other Devices, Nano Geometry in Macro Situations.
TOTAL : 45 PERIODS
OUTCOMES:
At the end of the course the students would be able to
1. Describe the working principle and applications of optical measuring instruments.
2. Apply advanced surface finish measurement techniques in manufacturing process analysis.
3. Analyse the performance of CMMs for measurement applications.
4. Explain the errors involved in precision machine tools and calculate the error budgets for a given situation.
5. Outline the principles and methods of nanometrology.
TEXT BOOKS:
1. Kevin Harding, “Handbook of Optical Dimensional Metrology, Series: Series in Optics and Optoelectronics”, Taylor & Francis, 2013.
2. David J. Whitehouse, “Handbook of Surface and Nanometrology”, Second Edition, CRC Press, 2010.
REFERENCES:
1. AmmarGrous,J“AppliedMetrologyforManufacturingEngineering”,Wiley-ISTE,2011.
2. DotsonConnie,“DimensionalMetrology”,CengageLearning,Firstedition,2012.
3. MarkCurtis,FrancisT.Farago,“HandbookofDimensionalMeasurement”,IndustrialPress,Fifthedition, 2013.
4. Toru Yoshizawa, “Handbook of Optical Metrology: Principles and Applications”, CRC Press, 2009.
5. Robert J. Hocken and Paulo H. Pereira, Coordinate measuring machines and systems, 2nd Edition, CRC press, 2012.