ML3401 Characterisation of Materials Syllabus:
ML3401 Characterisation of Materials Syllabus – Anna University Regulation 2021
COURSE OBJECTIVES:
The main learning objective of this course is to prepare students for:
1. Understanding the various techniques of structural characterization of materials.
2. Interpreting the microstructure, crystal structure and surface structure of materials.
3. on X-Ray diffraction techniques and analysis
4. To import knowledge on different electron microscopy techniques used for characterisation
5. To import knowledge on different electron microscopy techniques used for characterisation
6. To import knowledge on techniques of elemental chemical composition and structure of surface.
UNIT I METALLOGRAPHIC TECHNIQUES
Macro examination -applications, metallurgical microscope – construction and principle of working, specimen preparation, light material interaction – Rayleigh Scattering, Abbes theory; magnification, numerical aperture, resolving power, depth of focus, depth of field, different light sources; lenses aberrations and their remedial measures, Principles of microscopy -bright field , dark field, phasecontrast, polarization, differential interference contrast, high temperature microscopy; Quantitative metallography – Image analysis for grain size distribution and grain/precipitate shape.
UNIT II X-RAY DIFFRACTION TECHNIQUES
Reciprocal lattice, Stereographic projection, X-ray generation, absorption edges, characteristic and continuous spectrum, Bragg’s law, Ewald’s Sphere, Diffraction methods – Laue, rotating crystal and powder methods. Intensity of diffracted beams –structure factor calculations and other factors. Diffractometer – General features and optics, Counters – Proportional, Scintillating, Geiger counters and semiconductor based.
UNIT III ANALYSIS OF X-RAY DIFFRACTION
Line broadening-crystallite size, residual stress; Texture Analysis; Crystal structure determination indexing -Phase identification- ASTM catalogue of Materials identification, quantitative phase estimation, Phase diagram determination, Precise lattice parameter calculation, Determination of residual stress – double angle diffraction.
UNIT IV ELECTRON MICROSCOPY
Electron specimen interaction; Construction and operation of Transmission electron microscope (TEM) – specimen preparation techniques- Diffraction mode and image mode, Sources of contrast Selected Area Electron Diffraction, Zone axis, indexing ; Construction, modes of operation and sources of contrast of Scanning electron microscope(SEM), Electron probe micro analysis, Basics of Field ion microscopy (FIB), Scanning Tunnelling Microscope (STM) and Atomic Force Microscope(AFM).
UNIT V SURFACE ANALYSIS
X-ray emission spectroscopy – Energy Dispersive Spectroscopy- Wave Dispersive Spectroscopy Ultraviolet Photo Electron Spectroscopy (UPS), X ray Photoelectron Spectroscopy (XPS), Auger Electron Spectroscopy (AES), Electron Energy Analysers, Secondary ion mass spectrometry – Quadrupole mass spectrometer ; Surface Structure -Unit meshes of five types of surface nets – diffraction from diperiodic structures – Low Energy Electron Diffraction (LEED)- Reflection High Energy Electron Diffraction (RHEED).
TOTAL: 45 PERIODS
COURSE OUTCOMES:
Upon completion of course, the student will be able to
1. Describe the principle of metallography and its application.
2. Explain the principle of XRD and its scope for metallurgical analysis.
3. Interpret and analyse the XRD results.
4. Discuss the various techniques of electron microscopy and their applications.
5. Describe the different techniques for the analysis of elemental chemical composition and structure of surface.
TEXT BOOKS:
1. Angelo, P.C., “Materials Characterisation”, 1st Edition Cengage Publication, 2016.
2. Cullity, B. D., Stock, S.R. “Elements of X-ray diffraction”, Pearson New International Edition, 3rd Edition, 2014
REFERENCES:
1. Brandon D. G, “Modern Techniques in Metallography”, Von Nostrand Inc. NJ, USA, 1986.
2. D. A. Skoog, F. James Leary and T. A. Nieman, “Principles of Instrumental Analysis”, 7th edition, Cengage Learning, 2017.
3. Thomas G., “Transmission electron microscopy of metals”, John Wiley, 1996.
4. Whan R E (Ed), ASM Handbook, Volume 10, Materials Characterisation “, Nineth Edition, ASM international, USA, 1986.
5. Yang Leng, Materials Characterization: Introduction to Microscopic and Spectroscopic Methods, Hong Kong University of Science and Technology, John Wiley & Sons (Asia) Pte Ltd. 2010.