CMR333 Computer Aided Inspection and Testing Syllabus:
CMR333 Computer Aided Inspection and Testing Syllabus – Anna University Regulation 2021
COURSE OBJECTIVES:
1. To familiar the measurement standards and to know the instruments used and various errors in measurements
2. To recognize the use of basic and advanced instruments for measurements.
3. To learn the applications of opto-electronics device for measurements.
4. To describe the various measurement techniques using laser metrology.
5. To gain knowledge on computer aided inspection and advances in metrology.
UNIT – I FUNDAMENTALS AND CONCEPTS IN METROLOGY
Standards of Measurement – Analog and Digital Measuring Instruments – Comparators – Limits, Fits and Tolerances – Gauge Design –Surface Roughness – Form Errors and Measurements.
UNIT – II INSPECTION AND GENERAL MEASUREMENTS
Linear Measuring Instruments – Evolution – Types – Classification – Limit Gauges – Gauge Design – Terminology – Procedure – Concepts of Interchange Ability and Selective Assembly – Angular Measuring Instruments – Types – Bevel Protractor Clinometers Angle Gauges, Spirit Levels Sine Bar – Angle Alignment Telescope – Autocollimator – Applications – Inspection of Gears And Threads – Tool Makers’ Microscope – Universal Measuring Machine.
UNIT – III OPTO ELECTRONICS IN ENGINEERING INSPECTION
Use of Optoelectronics in Tool Wear Measurements – Microhole Measurement and Surface Roughness – Applications in In-Process Measurement and On-Line Inspection.
UNIT – IV LASER METROLOGY
Precision instrument based on Laser – Use of Lasers – Principle –Interferometers, Interference microscope -Optical flats – Laser Interferometer – Application in Linear and Angular measurements – Testing of machine tools using Laser Interferometer. Use of Laser Interferometer in Machine Tool Inspection – Uses of Laser in On-Line Inspection – Laser Micrometer – Laser Alignment Telescope.
UNIT – V COMPUTER AIDED INSPECTION AND ADVANCES IN METROLOGY
Co-ordinate Measuring Machines – Constructional features – Types – Applications of CMM – CNC CMM applications – Measurement arms, Laser tracker – Fundamentals of Computer Aided Inspection – Introduction to Nano metrology.
TOTAL: 45 PERIODS
COURSE OUTCOMES
Upon successful completion of the course, students should be able to:
CO1: Practice the standards in measurements and to avoid the various forms of errors in measurements.
CO2: Use of basic and advanced metrology instruments for measurements.
CO3: Acquire the knowledge on non-contact opto-electronics device for measurements.
CO4: Describe various measurement techniques using laser metrology.
CO5: Recognize the computer aided inspection and advances in metrology.
TEXT BOOKS
1. Anil. K. Jain, “Fundamentals of Digital Image Processing”, Prentice Hall of India Pvt. Ltd., 2006.
2. Alan S. Morris, “The Essence of Measurement”, Prentice Hall of India, 2002.
3. Beckwith, Marangoni, Lienhard, “Mechanical Measurements”, Pearson Education, 2014.
REFERENCES
1. Charles Reginald Shotbolt, “Metrology for Engineers”, Cengage Learning EMEA,5th edition, 1996.
2. Jain R.K., “Engineering Metrology”, Khanna Publishers, 2012.
3. Robert G. Seippel, “Opto-Electronics for Technology and Engineering”, Prentice Hall, 1989.
4. Robert J. Hocken, Paulo H. “Coordinate Measuring Machines and Systems”, CRC Press, 2nd edition, 2016.
